EMFFLUO

Summary

Activates a detailed treatment of photoelectric interactions and of the following atomic deexcitation, with production of fluorescence X-rays (and a rough treatment of Auger electrons) ​​​ ​​

See also EMF

This option, meaningful only if the EMF option has been requested (explicitly or implicitly via option DEFAULTS), requires a special unformatted file, pre-connected as logical input unit 13 (see Installation). This file is delivered with the FLUKA code.

WHAT(1) > 0.0:

set fluorescence on

< 0.0:

set fluorescence off

= 0.0:

ignored

Default

= -1.0  (no fluorescence) if option DEFAULTS is not used, or if it is used with anything but CALORIMEtry, DAMAGE, EM–CASCAde, HADROTHErapy, ICARUS or PRECISIOn.

If DEFAULTS is used with with a SDUM value equal to one of the latter, the default is 1.0 (fluorescence on).

WHAT(2) =

lower bound (or corresponding name) of the material indices in which fluorescence is activated

(“From material ``WHAT(2)``…”)

Default

= 3.0

WHAT(3) =

upper bound (or corresponding name) of the material indices in which fluorescence is activated

(“…to material ``WHAT(3)``…”)

Default

= WHAT(2)

WHAT(4) =

step length in assigning indices

(”…in steps of ``WHAT(4)`` ”)

Default

= 1.0

WHAT(5),

WHAT(6), SDUM: not used

Default

(option EMFFLUO not requested): fluorescence is not simulated unless option DEFAULTS is chosen with SDUM = CALORIMEtry, DAMAGE,EM–CASCA, HADROTHErapy, ICARUS or PRECISIOn.

See also Table 7.1 at.

Notes

1. Selection of EMFFLUO option is only meaningful for a material defined with electron and photon cutoffs lower than the highest K-edge​ in the elements constituents of that material.

2. When EMFFLUO is activated for a compound material, if the incident photon energy is lower than the highest K-edge​ for any constituent element, FLUKA uses separate parameterised representations of the photoelectric cross section​ between different edges of each constituent element (all levels are tabulated).

   If the photon energy is higher than the highest K-edge, average cross sections for the compound are used, but FLUKA still samples a single element on which to interact, in order to generate the correct fluorescence photon or Auger electron​.

Example (number-based):

*...+....1....+....2....+....3....+....4....+....5....+....6....+....7...
EMF
EMFCUT         1.E-5     1.E-5       0.0       17.       18.
EMFFLUO          1.0       17.       18.
*   In the above example, the user activates fluorescence production in
*   Lead and Tantalum (standard FLUKA material numbers 17 and 18). The
*   photon and electron cutoff has been set at 10 keV (the K-edge for
*   Pb and Ta is of the order of 100 keV).

The same example, name-based:

EMF
EMFCUT         1.E-5     1.E-5       0.0      LEAD  TANTALUM
EMFFLUO          1.0      LEAD  TANTALUM